Javascript is required
Skip to main content

Field-Emission Scanning Electron Microscope

Field-Emission Scanning Electron Microscope

Introduction:
A field emission scanning electron microscope (FE-SEM) operates by applying a negative voltage to a metallic tip, generating an electric field that extracts electrons from the tip, forming an extremely fine electron beam. It functions under ultra-high vacuum conditions (approximately 10⁻¹⁰ torr), enabling the acquisition of high-resolution images. With the advancement of science and technology, nanoscience and nanotechnology have become central pillars of national high-tech development due to their ability to meet the demands of miniaturization. By controlling material composition and interfacial structures within the 1–100 nanometer scale and observing resulting changes in physical, chemical, and biological properties, various industrial applications can be developed. The FE-SEM serves as one of the most essential tools for measuring and manipulating nanostructures.


Instrument Description:

  • Model: Hitachi-S4700

  • EDS System: HORIBA

Ⅰ. Acceleration Voltage: 0.5–30 kV
Ⅱ. Electron Source: Cold Field Emission Gun
Ⅲ. Magnification Range: 30X ~ 500,000X
Ⅳ. High-Resolution Imaging: Resolution: 1.5 nm
Ⅴ. EDS Analysis Capability: Detectable elements with atomic numbers ≥ 5 and ≤ 92
Ⅵ. Auto Functions: Autofocus, aberration correction, brightness, and contrast adjustment


Main Accessories:
Ⅰ. EDS (Qualitative, quantitative, and distribution imaging analysis of chemical elements)


Sample Preparation Guidelines:

  1. Sample Size: The specimen height must not exceed 0.8 cm, and the size must be smaller than a 3.2 cm diameter.


  2. Contamination Prevention: To avoid contamination of the ultra-high vacuum, samples must not contain volatile, contaminant, magnetic powders, or moisture.


  3. First-Time Users: First-time users must consult with a technical staff member about sample preparation before observation.


Instrument Usage Fees:

  1. External Service Operation: NT$1,600/hour or NT$4,500/3 hours

  2. EDS Point/Area Analysis: NT$50 per location

  3. EDS Mapping: NT$100 per location

  4. Gold Coating: NT$200 per 60 seconds


    Instrument Manager: Ms. Hsiu-Feng Tsao

    Phone/Extension: +886-7-6577711 ext. 3986

    Location: Room 2101, 1st Floor, College of Engineering, Main Campus


    Reservation:(Click here to make a reservation)

    First-time external users must register for an account before making a reservation